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1 article(s) from Bubendorf, Alexandre

A robust AFM-based method for locally measuring the elasticity of samples

Alexandre Bubendorf,
Stefan Walheim,
Thomas Schimmel and
Ernst Meyer

Beilstein J. Nanotechnol. 2018, 9, 1–10, doi:10.3762/bjnano.9.1

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Figure 1: Feedback loops necessary to track the flexural contact resonances of the cantilever. The main feedb...

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Figure 2: Left: Force–distance and frequency shift–distance curves of LLDPE, PP, PS and FDTS for the determin...

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Figure 3: Left: Force–distance and frequency shift–distance curves of PTFE. The curves of Δf₁ and Δf₂ as a fu...

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Figure 4: (a) Cantilever in contact with the sample surface modeled by two springs in series, k₁ and k_sample,...

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Figure 5: Three phases characterizing the evolution of stress σ during indentation. This evolution is respons...

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Figure 6: Mapping of (a) topography and (b) elastic modulus of 2.5 μm × 2.5 μm areas of the LLDPE, PP and PS ...

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Figure 7: Mapping of (a) topography and (b) elastic modulus of a 2.5 μm × 2.5 μm area of the FDTS + SiOx SAM ...

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Figure 8: Line profile of the SiOx holes in the topographical mapping of the SAM showing their relative heigh...

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Published 02 Jan 2018

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